Patent · US Expired

Interconnect array formed at least in part with repeated application of an interconnect pattern

US7501341B1 · kind B1 · utility

8Cited by
16References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 5, 2005
Grant dateMar 10, 2009
Priority date
Expiry dateSep 23, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An interconnect array formed at least in part using repeated application of an interconnect pattern is described. The interconnect pattern has at least ten interconnect locations. One of the ten interconnect locations is for a power interconnect. Another one of the ten interconnect locations is for a ground interconnect. At least eight interconnect locations remaining are for additional interconnects. The at least eight remaining interconnect locations disposed around a medial region, where either the ground interconnect or the power interconnect is located in the medial region. An offset region having the one of either the ground interconnect or the power interconnect not in the medial region. The interconnect array is at least partially formed by repeated application of the interconnect pattern off-set from one another responsive to the offset region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.