Methods and system for ultrasound inspection
US7503218B2 · kind B2 · utility
3Cited by
15References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2007 |
| Grant date | Mar 17, 2009 |
| Priority date | — |
| Expiry date | Jan 10, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2696
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for fabricating a component is provided. The method includes receiving an ultrasound image of the component, selecting a subimage that includes a first surface of the component and an inspection area of the component, combining a filtered subimage with the selected subimage, and outputting the combined image to at least one of a display and an analyzer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.