Patent · US Active

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

US7511521B2 · kind B2 · utility

5Cited by
10References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 2008
Grant dateMar 31, 2009
Priority date—
Expiry dateMar 10, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2886
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In one embodiment, the invention provides a test assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component. The assembly comprises a contactor assembly to interconnect with the test component, a probe assembly to mechanically support the contactor assembly and electrically connect the contactor assembly to the testing machine, and a clamping mechanism comprising a first clamping member and a second clamping member, the clamping members being urged together to exert a clamping force to deform contactor bumps of an electrical connection between the probe assembly and the contactor assembly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.