AEHR TEST SYSTEMS
🏢 View company profile →89Patents
61Active
89Granted
55Portfolio score
Filing activity: May 18, 1990 → Oct 16, 2024 · 13 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6340895B1 | Wafer-level burn-in and test cartridge | Physics | 131 | Expired |
| US6580283B1 | Wafer level burn-in and test methods | Physics | 92 | Expired |
| US5517125A | Reusable die carrier for burn-in and burn-in process | Physics | 50 | Expired |
| US5682472A | Method and system for testing memory programming devices | Physics | 49 | Expired |
| US5093984A | Printed circuit board loader/unloader | Emerging Cross-Sectional Technologies | 37 | Expired |
| US8030957B2 | System for testing an integrated circuit of a device and its method of use | Physics | 37 | Active |
| US7800382B2 | System for testing an integrated circuit of a device and its method of use | Physics | 35 | Active |
| US7826995B2 | Apparatus for testing electronic devices | Physics | 34 | Active |
| US7053644B1 | System for testing and burning in of integrated circuits | Physics | 28 | Expired |
| US6853209B1 | Contactor assembly for testing electrical circuits | Emerging Cross-Sectional Technologies | 28 | Expired |
| US6867608B2 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Physics | 26 | Expired |
| US7762822B2 | Apparatus for testing electronic devices | Physics | 25 | Active |
| US5429510A | High-density interconnect technique | Electricity | 24 | Expired |
| US7969175B2 | Separate test electronics and blower modules in an apparatus for testing an integrated circuit | Physics | 24 | Active |
| US8228085B2 | System for testing an integrated circuit of a device and its method of use | Physics | 23 | Active |
| US6025732A | Reusable die carrier for burn-in and burn-in process | Physics | 23 | Expired |
| US8628336B2 | Apparatus for testing electronic devices | Physics | 23 | Active |
| US8947116B2 | System for testing an integrated circuit of a device and its method of use | Physics | 20 | Active |
| US9625521B2 | Controlling alignment during a thermal cycle | Physics | 20 | Active |
| US9880197B2 | Controlling alignment during a thermal cycle | Physics | 20 | Active |
| US6140616A | Wafer level burn-in and test thermal chuck and method | Electricity | 20 | Expired |
| US6413113B2 | Kinematic coupling | Physics | 18 | Expired |
| US10401385B2 | Limiting translation for consistent substrate-to-substrate contact | Physics | 18 | Active |
| US9250291B2 | System for testing an integrated circuit of a device and its method of use | Physics | 17 | Active |
| US9316683B2 | Apparatus for testing electronic devices | Physics | 17 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.