Patent · US Active

Reflection-testing device and method for use thereof

US7515254B2 · kind B2 · utility

0Cited by
1References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 21, 2006
Grant dateApr 7, 2009
Priority date
Expiry dateDec 21, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/0257
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reflection-testing device for testing for unwanted reflections in a lens module (12) includes a plurality of light sources (18) and an image capturer (16). The plurality of light sources is provided around the top end of the lens module, and the image capturer is provided near the other end of the lens module for receiving optical signals through the lens module. A lens reflection testing method is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.