Determining frequency components of jitter
US7519490B2 · kind B2 · utility
1Cited by
10References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 25, 2008 |
| Grant date | Apr 14, 2009 |
| Priority date | — |
| Expiry date | Jan 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining frequency components of jitter in a waveform is provided. The method includes strobing a waveform having a repetitive pattern. Forming a locally-in-order strobing scheme of a representative one of the repetitive pattern including subsets of locally-in-order strobes. Locating transition regions in the subsets of locally-in-order strobes. Determining random jitter associated for each transition region and determining jitter as a function of frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.