Quantized data-dependent jitter injection using discrete samples
US7536621B2 · kind B2 · utility
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3References
21Claims
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Key dates
| Filing date | Dec 8, 2006 |
| Grant date | May 19, 2009 |
| Priority date | — |
| Expiry date | Oct 2, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, system, and computer programs for compensating for introducing data dependent jitter into a test signal using a testing instrument are disclosed. The method includes generating a test pattern that comprises a plurality of intervals. Each of the intervals includes a number of redundant samples that correspond to a sample in a test source pattern. The test pattern is digitally modified to generate a modified test pattern that includes data dependent jitter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.