Dynamic computation of ESD guidelines
US7558720B1 · kind B1 · utility
2Cited by
2References
1Claims
0Family size
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Key dates
| Filing date | Jan 9, 2006 |
| Grant date | Jul 7, 2009 |
| Priority date | — |
| Expiry date | Nov 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An automated method for checking electrostatic discharge (ESD) guidelines ensures that a sufficient number of ESD protection cells have been provided in the neighborhood of each pad in an integrated circuit design to ensure adequate current sinking and voltage clamping during the occurrence of an ESD event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.