Inventor · Pleasanton, CA, US

Marcel ter Beek

19Patents
7h-index
9Co-inventors
51Inventor score

Filing activity: Mar 12, 2002 → Aug 16, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US6906357B1 Electrostatic discharge (ESD) protection structure with symmetrical positive and negative ESD protection Electricity 23 Expired
US6784029B1 Bi-directional ESD protection structure for BiCMOS technology Electricity 22 Expired
US7023029B1 Complementary vertical SCRs for SOI and triple well processes Electricity 18 Expired
US6717219B1 High holding voltage ESD protection structure for BiCMOS technology Electricity 14 Expired
US7056761B1 Avalanche diode with breakdown voltage controlled by gate length Emerging Cross-Sectional Technologies 12 Expired
US6720624B1 LVTSCR-like structure with internal emitter injection control Electricity 9 Expired
US6841829B1 Self protecting bipolar SCR Electricity 7 Expired
US6690069B1 Low voltage complement ESD protection structures Electricity 5 Expired
US6660602B1 Stand-alone triggering structure for ESD protection of high voltage CMOS Electricity 5 Expired
US6911679B1 LVTSCR with compact design Electricity 4 Expired
US6853053B1 BJT based ESD protection structure with improved current stability Electricity 4 Expired
US7057215B1 PMOS based LVTSCR and IGBT-like structure Electricity 4 Expired
US6970335B1 LVTSCR ESD protection clamp with dynamically controlled blocking junction Electricity 3 Expired
US7193251B1 ESD protection cluster and method of providing multi-port ESD protection Electricity 3 Expired
US6933588B1 High performance SCR-like BJT ESD protection structure Emerging Cross-Sectional Technologies 3 Expired
US7115951B1 Low triggering voltage ESD protection structure and method for reducing the triggering voltage Electricity 3 Expired
US7558720B1 Dynamic computation of ESD guidelines Physics 2 Active
US6952039B1 ESD protection snapback structure for overvoltage self-protecting I/O cells Electricity 1 Expired
US7352032B1 Output driver with split pins Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.