X-ray micro-tomography system optimized for high resolution, throughput, image quality
US7561662B2 · kind B2 · utility
48Cited by
4References
15Claims
0Family size
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Key dates
| Filing date | Feb 12, 2008 |
| Grant date | Jul 14, 2009 |
| Priority date | — |
| Expiry date | Feb 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.