Mechanism for determining an accelerated test specification for device elements
US7571059B2 · kind B2 · utility
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2References
18Claims
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Assignee
Inventors
Key dates
| Filing date | Jun 28, 2006 |
| Grant date | Aug 4, 2009 |
| Priority date | — |
| Expiry date | Aug 17, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0256
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A mechanism is disclosed for determining an accelerated test for a device. The method comprises calculating an estimated amount of damage that an element of the device would suffer if the device were operated under a set of specified conditions over a certain period of time (e.g., expected lifetime of the device). The method further comprises determining an accelerated test to which to subject the element in order to cause the element to suffer an actual amount of damage that is approximately equal to the estimated amount of damage. The accelerated test may be an accelerated test cycle, such as an accelerated temperature cycle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.