Patent · US Active

Method and apparatus for cleaning semiconductor photolithography tools

US7572342B2 · kind B2 · utility

1Cited by
2References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 2, 2006
Grant dateAug 11, 2009
Priority date
Expiry dateApr 10, 2027

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/906
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A system for cleaning semiconductor lithography tools provides for cycling a polished-side down semiconductor wafer through the lithography tool using conventional automated robotics for loading and unloading the wafer from a vacuum chuck of the lithography tool. The vacuum chuck may provide a continuous clamping vacuum feature and may include a vacuum ring that surround the periphery of the vacuum chuck. The chuck and vacuum ring may advantageously be formed of a high accuracy ceramic or plastic such as ZeroDur ceramic. The polished side of the semiconductor wafer includes grooves in a polished surface and which extend inwardly from a peripheral edge of the wafer, the grooves provide gaps between the wafer and chuck allowing the wafer to be released by a slow loss of vacuum-pressure through the gaps. The pristine clean polished surface of the wafer getters contaminating particles from the chuck.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.