Patent · US Active

Adjustable test socket

US7581962B2 · kind B2 · utility

3Cited by

7References

4Claims

0Family size

Assignee

Interconnect Devices, Inc. · US

Inventors

David Henry · Platte City, US
Jason W. Farris · Parkville, US
Joseph J. Caven · Kansas City, US
Donald A. Marx · Olathe, US

Key dates

Filing date	Mar 8, 2007
Grant date	Sep 1, 2009
Priority date	—
Expiry date	Mar 8, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0483
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.