Method and its apparatus for classifying defects
US7583832B2 · kind B2 · utility
10Cited by
9References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2003 |
| Grant date | Sep 1, 2009 |
| Priority date | — |
| Expiry date | Oct 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/001
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A highly reliable defect automatic classifying method and apparatus capable of flexibly coping with a request for classifying a defect given by each user without having to collect lots of teach data items. A classifying class arrangement is defined by a user by combining classes supplied by the system itself or classes defined by the user and, further, a priori knowledge on the defect class is given by the user as a restriction so as to carry out restricted learning.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.