Physical design characterization system
US7584077B2 · kind B2 · utility
6Cited by
19References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2004 |
| Grant date | Sep 1, 2009 |
| Priority date | — |
| Expiry date | Aug 4, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system, method and media for locating and defining process sensitive sites isolated to specific geometries or shape configurations within chip design data. Once a systemic process sensitive site is identified, a 3D design checking deck is coded and executed through a design checker on physical design data. Target match shapes are produced and embedded back into the design data. Pictures, maps and coordinates of process sensitive sites are produced and sent to a website library for reference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.