Inventor · Craftsbury Common, VT, US

Daniel N. Maynard

33Patents
8h-index
56Co-inventors
74Inventor score

Filing activity: May 19, 1995 → Sep 12, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US7503020B2 IC layout optimization to improve yield Physics 107 Active
US6738954B1 Method for prediction random defect yields of integrated circuits with accuracy and computation time controls Physics 67 Expired
US5636133A Efficient generation of fill shapes for chips and packages Physics 43 Expired
US5734192A Trench isolation for active areas and first level conductors Electricity 17 Expired
US7076749B2 Method and system for improving integrated circuit manufacturing productivity Emerging Cross-Sectional Technologies 14 Expired
US6823496B2 Physical design characterization system Physics 13 Expired
US7893468B2 Optical sensor including stacked photodiodes Electricity 13 Active
US6394638B1 Trench isolation for active areas and first level conductors Electricity 8 Expired
US7353472B2 System and method for testing pattern sensitive algorithms for semiconductor design Physics 8 Expired
US7883916B2 Optical sensor including stacked photosensitive diodes Electricity 7 Active
US7584077B2 Physical design characterization system Physics 6 Active
US8405751B2 Image sensor pixel structure employing a shared floating diffusion Electricity 6 Active
US7404164B2 IC design modeling allowing dimension-dependent rule checking Physics 5 Expired
US7404174B2 method for generating a set of test patterns for an optical proximity correction algorithm Emerging Cross-Sectional Technologies 5 Active
US7284230B2 System for search and analysis of systematic defects in integrated circuits Physics 3 Expired
US7415695B2 System for search and analysis of systematic defects in integrated circuits Physics 2 Active
US7818694B2 IC layout optimization to improve yield Physics 2 Active
US6021267A Aspect ratio program for optimizing semiconductor chip shape Physics 2 Expired
US7703061B2 IC design modeling allowing dimension-dependent rule checking Physics 2 Active
US7661081B2 Content based yield prediction of VLSI designs Physics 1 Active
US7555735B2 IC design modeling allowing dimension-dependent rule checking Physics 1 Active
US7389480B2 Content based yield prediction of VLSI designs Physics 1 Active
US8201132B2 System and method for testing pattern sensitive algorithms for semiconductor design Physics 1 Active
US8704325B2 Pixel sensors of multiple pixel size and methods of implant dose control Electricity 0 Active
US7398485B2 Yield optimization in router for systematic defects Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.