Re-configurable architecture for automated test equipment
US7590903B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 15, 2006 |
| Grant date | Sep 15, 2009 |
| Priority date | — |
| Expiry date | Jun 3, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31907
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An adaptive test system includes one or more reconfigurable test boards, with each test board including at least one re-configurable test processor. The re-configurable test processors can transmit communicate with one another using an inter-processor communications controller associated with each re-configurable test processor. The communications include configuration information, control information, communication protocols, stimulus data, and responses. Configuration information and stimulus data can also be read from a memory. Configuration information is used to configure one or more re-configurable test processors. Once configured, the re-configurable test processor or processors process the data in order to generate one or more test signals. The one or more test signals are then used to test a DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.