Method and system for designing a probe card
US7593872B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2006 |
| Grant date | Sep 22, 2009 |
| Priority date | — |
| Expiry date | Aug 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/073
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.