Patent · US Active

System and method for reducing heat dissipation during burn-in

US7595652B2 · kind B2 · utility

1Cited by

38References

10Claims

0Family size

Inventors

Eric Chen-Li Sheng · San Jose, US
David H. Hoffman · Sunnyvale, US
John Laurence Niven · Livermore, US

Key dates

Filing date	Jul 10, 2007
Grant date	Sep 29, 2009
Priority date	—
Expiry date	Jul 10, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31721
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A plurality of devices under test are each subject to a body bias voltage during burn-in testing. The body bias voltage reduces leakage current associated with the devices under test. A test controller can access a store of information including leakage current as a function of body bias voltage and can select a body bias voltage that corresponds to the minimum leakage current in the store of information. A voltage supply coupled to the test controller can provide the body bias voltage corresponding to the minimum leakage current to the devices under test during the burn-in testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.