Measurement probe
US7603789B2 · kind B2 · utility
11Cited by
10References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 24, 2006 |
| Grant date | Oct 20, 2009 |
| Priority date | — |
| Expiry date | Dec 28, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for position determining apparatus has a probe body (18) and a workpiece-contacting stylus (14). A strain sensitive structure connects the probe body and the stylus, and includes bendable members (32). The bendable members have an asymmetric cross-section, e.g. “T” shaped. A strain gauge (33) is mounted to the stem of the “T” to detect the bending caused when the stylus contacts a workpiece. This enables the strain sensitive structure to be both robust and sensitive to the bending.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.