Optical lattice microscopy
US7609391B2 · kind B2 · utility
Inventor
Key dates
| Filing date | May 22, 2007 |
| Grant date | Oct 27, 2009 |
| Priority date | — |
| Expiry date | Feb 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/653
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical system includes a substrate adapted for supporting a sample, where the substrate has a refractive index, nsub, larger than a refractive index of the sample, nsample, a source of electromagnetic radiation having wavelength, λo, and a detector having multiple individual detector elements configured for detecting a signal resulting from an interaction of the electromagnetic radiation with the sample. The system includes dividing optics, directing optics, and control optics. The dividing optics are configured for dividing the electromagnetic radiation from the source into at least three substantially independent excitation beams. The directing optical elements are configured for directing each excitation beam in a unique direction, kn, through the substrate and incident upon an interface between the substrate an the sample at angles relative to a normal axis to the interface, êz, such that each excitation beam is divided into a reflected beam and an evanescent interfacial beam within the sample that travels in the plane of the interface. The evanescent beams at least partially intersect with each other within at least a portion of the sample to create an excitation region wi…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.