Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus
US7609803B2 · kind B2 · utility
3Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Oct 2, 2008 |
| Grant date | Oct 27, 2009 |
| Priority date | — |
| Expiry date | Oct 2, 2028 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/5282
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.