Test apparatus, manufacturing method, and test method
US7612698B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 25, 2008 |
| Grant date | Nov 3, 2009 |
| Priority date | — |
| Expiry date | Jun 25, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
There is provided a test apparatus for testing a device under test, the test apparatus including: a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test; a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal; a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.