Patent · US Expired

Method and apparatus for forming expitaxial layers

US7615390B2 · kind B2 · utility

7Cited by
3References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2003
Grant dateNov 10, 2009
Priority date
Expiry dateAug 13, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0262
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a method of depositing epitaxial layers based on Group IV elements on a silicon substrate by Chemical Vapor Deposition, wherein nitrogen or one of the noble gases is used as a carrier gas, and the invention further provides a Chemical Vapor Deposition apparatus (10) comprising a chamber (12) having a gas input port (14) and a gas output port (16), and means (18) for mounting a silicon substrate within the chamber (12), said apparatus further including a gas source connected to the input port and arranged to provide nitrogen or a noble gas as a carrier gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.