Patent · US Active

Multiple metal-insulator-metal capacitors and method of fabricating the same

US7623338B2 · kind B2 · utility

12Cited by
10References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 30, 2006
Grant dateNov 24, 2009
Priority date
Expiry dateDec 18, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In a device including multiple metal-insulator-metal (MIM) capacitors and a method of fabricating the same, the multiple MIM capacitors comprise a lower interconnect in a substrate; a first dielectric layer on the lower interconnect; a first intermediate electrode pattern on the first dielectric layer overlapping with the lower interconnect; a second intermediate electrode pattern on the first dielectric layer and spaced apart from the first intermediate electrode pattern in a same plane of the device as the first intermediate electrode pattern; a second dielectric pattern on the second intermediate electrode pattern; and an upper electrode pattern on the second dielectric pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.