System and method of curve fitting
US7627622B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2004 |
| Grant date | Dec 1, 2009 |
| Priority date | — |
| Expiry date | Oct 29, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/17
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to fitting a curve to a plurality of data points. A “seed curve” is determined from a first set of data points selected from the plurality of data points. From the remaining data points, data points are individually selected and a determination is made for each selected data point as to whether the data point is acceptable to be included with the first set of data points. When a data point is determined to be acceptable, the data point is included with the first set of data points to form another set of data points. After each of the other data points are evaluated for inclusion with the first set of data points, a best fit curve is determined from a final set of data points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.