Count uniformity correction in flux space for pixilated semiconducting radiation detectors
US7633068B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 13, 2007 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Mar 13, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/773
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In operation of a photon counting detecting system (10), a number of pulse counts output by least one pixel (20) of a photon counting detector in response to experiencing a photon flux density during a sample interval is acquired and a photon flux density (46) or value related thereto corresponding to the pulse counts output by the pixel (20) is determined. A correction (48) for the thus determined photon flux density (46) or value related thereto is determined. A corrected number of pulse counts (52) is determined for the pixel (20) as a function of the thus determined corrected photon flux density value or value related thereto. An image can be displayed that is a function of the corrected number of pulse counts for pixels of the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.