Patent · US Active

Method of retaining a substrate to a wafer chuck

US7636999B2 · kind B2 · utility

33Cited by
120References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2005
Grant dateDec 29, 2009
Priority date
Expiry dateOct 20, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49998
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of retaining a substrate to a wafer chuck. The method features accelerating a portion of the substrate toward the wafer chuck, generating a velocity of travel of the substrate toward the wafer chuck, and reducing the velocity before the substrate reaches the wafer chuck. In this manner, the force of impact of the portion with the wafer chuck is greatly reduced, which is believed to reduce the probability that the structural integrity of the substrate, and layers on the substrate and/or the wafer chuck, are damaged.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.