Patent · US Expired

High holding voltage dual direction ESD clamp

US7639464B1 · kind B1 · utility

14Cited by
5References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 15, 2006
Grant dateDec 29, 2009
Priority date
Expiry dateMar 24, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/811

Abstract

In a dual direction ESD protection structure, first and second NMOS devices are serially connected back-to-back by connecting their drains or their sources using a common floating interconnect, while ensuring that the devices remain isolated from each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.