Method for automated testing of the modulation transfer function in image sensors
US7646016B2 · kind B2 · utility
1Cited by
6References
12Claims
0Family size
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Key dates
| Filing date | Jun 22, 2006 |
| Grant date | Jan 12, 2010 |
| Priority date | — |
| Expiry date | Jun 14, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.