Patent · US Expired

Bond pads and methods for fabricating the same

US7646097B2 · kind B2 · utility

5Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 2005
Grant dateJan 12, 2010
Priority date
Expiry dateMay 22, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

Bond pads for semiconductor devices and method for fabricating the same are provided. A bond pad has a first passivation layer having a plurality of openings. A conductive layer which overlies the openings and portions of the first passivation layer, having a first portion overlying the first passivation layer and a second portion overlying the openings. A second passivation layer overlies the first passivation layer and covers edges of the conductive layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.