Patent · US Active

Method and apparatus for determining the performance of an integrated circuit

US7650580B2 · kind B2 · utility

16Cited by

3References

41Claims

0Family size

Assignee

SYNOPSYS, INC. · US

Inventors

Kayhan Kucukcakar · Los Altos, US
Ali Dasdan · San Jose, US
Halim Damerdji · Los Altos, US

Key dates

Filing date	Dec 21, 2006
Grant date	Jan 19, 2010
Priority date	—
Expiry date	Jan 31, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2894
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system that determines the performance of an integrated circuit (IC). During operation, the system receives probability distributions for parameters for the IC. Next, the system generates samples of the IC, wherein generating a given sample involves using the probability distribution to assign values to the parameters for components within the IC. The system then calculates output performance metrics for the samples based on the assigned values of the parameters, and uses the calculated output performance metrics to generate a distribution of output performance metrics for the samples.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.