Sequential semiconductor device tester
US7652497B2 · kind B2 · utility
2Cited by
8References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2007 |
| Grant date | Jan 26, 2010 |
| Priority date | — |
| Expiry date | Oct 29, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of generating a test pattern data for a test of a semiconductor device and a function of carrying out the test are separated to sequentially test the semiconductor device, to maintain a signal integrity and to improve an efficiency of the test by carrying out a test under an application environment or an ATE test according to the test pattern data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.