Patent · US Active

C4 joint reliability

US7656035B2 · kind B2 · utility

0Cited by
5References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2009
Grant dateFeb 2, 2010
Priority date
Expiry dateJan 9, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/014
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In one embodiment, the invention provides a method comprising fabricating a die bump on a die, the die bump being shaped and dimensioned to at least reduce the flow of solder material used, to attach the die bump to a package substrate, towards an under bump metallurgy (UBM) layer located below the die bump. Advantageously, the method may comprise performing a substrate reflow operation to attach the package substrate to the die bump, without performing a separate wafer reflow operation to reflow the die bump.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.