Dongming He
17Patents
5h-index
28Co-inventors
66Inventor score
Filing activity: May 8, 2001 → Jan 12, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8963339B2 | Stacked multi-chip integrated circuit package | Electricity | 55 | Active |
| US7251389B2 | Embedded on-die laser source and optical interconnect | Physics | 38 | Expired |
| US6573734B2 | Integrated thin film liquid conductivity sensor | Physics | 17 | Expired |
| US6989586B2 | Integrated circuit packages with reduced stress on die and associated substrates, assemblies, and systems | Emerging Cross-Sectional Technologies | 16 | Expired |
| US7517787B2 | C4 joint reliability | Electricity | 5 | Expired |
| US9406649B2 | Stacked multi-chip integrated circuit package | Electricity | 3 | Active |
| US7465651B2 | Integrated circuit packages with reduced stress on die and associated methods | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7626251B2 | Microelectronic die assembly having thermally conductive element at a backside thereof and method of making same | Electricity | 1 | Active |
| US11437335B2 | Integrated circuit (IC) packages employing a thermal conductive package substrate with die region split, and related fabrication methods | Electricity | 0 | Active |
| US11694982B2 | Sidewall wetting barrier for conductive pillars | Electricity | 0 | Active |
| US11948909B2 | Package comprising spacers between integrated devices | Electricity | 0 | Active |
| US9607777B2 | Separator and electrochemical device | Emerging Cross-Sectional Technologies | 0 | Active |
| US11417622B2 | Flip-chip device | Electricity | 0 | Active |
| US11557557B2 | Flip-chip flexible under bump metallization size | Electricity | 0 | Active |
| US7656035B2 | C4 joint reliability | Electricity | 0 | Active |
| US12113038B2 | Thermal compression flip chip bump for high performance and fine pitch | Electricity | 0 | Active |
| US11721656B2 | Integrated device comprising pillar interconnect with cavity | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.