Method of aligning probe for eddy current inspection
US7657389B2 · kind B2 · utility
4Cited by
2References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2006 |
| Grant date | Feb 2, 2010 |
| Priority date | — |
| Expiry date | Oct 3, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.