System and method of digitally testing an analog driver circuit
US7659740B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 11, 2008 |
| Grant date | Feb 9, 2010 |
| Priority date | — |
| Expiry date | Aug 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318544
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Digital testing of an analog driver circuit is enabled using a circuit including a control circuit for generating signals, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit, and a differential receiver circuit for converting the differential output signal to a single ended signal and transmitting the single ended signal. The testing includes skewing a differential output termination impedance, adjusting a differential receiver circuit voltage offset, selecting a differential driver circuit power level, enabling a decoder which activates only one differential driver circuit segment per test sequence, activating a segment, stimulating the differential driver circuit with digital test patterns, receiving differential driver circuit output, converting the output to a single-ended signal, and observing the single-ended signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.