Content based yield prediction of VLSI designs

US7661081B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Robert J. Allen · South Harwich, US
• Daria R. Dooling · Waterbury, US
• Jason D. Hibbeler · Williston, US
• Daniel N. Maynard · Craftsbury Common, US
• Sarah C. Prue · South Burlington, US
• Ralph J. Williams · South Burlington, US

Key dates

• Filing date: Apr 11, 2008
• Grant date: Feb 9, 2010
• Expiry date: Jul 23, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F30/30
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

An integrated circuit system and program product for predicting yield of a VLSI design. An integrated circuit system is provided including a system for identifying and grouping sub-circuits contained within an integrated circuit design by circuit type; a critical area calculation system for determining critical area values for different regions, wherein each different region is associated with a circuit type; a tallying system for calculating a plurality of tallies of critical area values based on circuit type; and a plurality of modeling subsystems for separately modeling each of the plurality of tallies based on circuit type.