Patent · US Expired

Method and apparatus for quantitative analysis using terahertz radiation

US7663107B2 · kind B2 · utility

8Cited by
2References
29Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 24, 2004
Grant dateFeb 16, 2010
Priority date
Expiry dateMay 24, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/129
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of quantitatively analysing a sample, the method comprising: irradiating the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz; detecting radiation reflected from and/or transmitted by said sample to obtain a frequency domain waveform of said sample; identifying at least one section of interest of said frequency domain wave-form containing spectral features due to intermolecular or other non-intramolecular excitations; and obtaining a value related to the concentration of a component of the sample from the said section.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.