Method and apparatus for quantitative analysis using terahertz radiation
US7663107B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 24, 2004 |
| Grant date | Feb 16, 2010 |
| Priority date | — |
| Expiry date | May 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/129
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of quantitatively analysing a sample, the method comprising: irradiating the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz; detecting radiation reflected from and/or transmitted by said sample to obtain a frequency domain waveform of said sample; identifying at least one section of interest of said frequency domain wave-form containing spectral features due to intermolecular or other non-intramolecular excitations; and obtaining a value related to the concentration of a component of the sample from the said section.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.