Apparatus and method for adjusting an orientation of probes
US7671614B2 · kind B2 · utility
7Cited by
25References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2005 |
| Grant date | Mar 2, 2010 |
| Priority date | — |
| Expiry date | Mar 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.