Patent · US Expired

Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points

US7675036B2 · kind B2 · utility

4Cited by
2References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 2005
Grant dateMar 9, 2010
Priority date
Expiry dateAug 26, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/3563
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of investigating an object, comprising the steps of: (a) irradiating the object with an optically-generated pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 100 GHz to 100 THz; (b) detecting radiation transmitted and/or reflected from the object to obtain a time domain waveform; (c) repeating steps (a) and (b) for a plurality of points on the object and (d) combining data from step (c) to produce a time domain waveform for the object which has been averaged over the plurality of points.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.