Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points
US7675036B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 26, 2005 |
| Grant date | Mar 9, 2010 |
| Priority date | — |
| Expiry date | Aug 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of investigating an object, comprising the steps of: (a) irradiating the object with an optically-generated pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 100 GHz to 100 THz; (b) detecting radiation transmitted and/or reflected from the object to obtain a time domain waveform; (c) repeating steps (a) and (b) for a plurality of points on the object and (d) combining data from step (c) to produce a time domain waveform for the object which has been averaged over the plurality of points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.