Patent · US Expired

Protection of an integrated circuit and method thereof

US7680622B2 · kind B2 · utility

6Cited by
13References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 13, 2005
Grant dateMar 16, 2010
Priority date
Expiry dateJun 2, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit comprises a power device located on a die. The power device is operably coupled to a processing function, wherein the signal processing function is operably coupled to two or more temperature sensors. A first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is located, such that it measures a substantially ambient temperature related to the die. The signal processing function determines the temperature gradient therebetween.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.