Patent · US Active

Nitride semiconductor device and method of manufacturing the same

US7687294B2 · kind B2 · utility

2Cited by
11References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 2007
Grant dateMar 30, 2010
Priority date
Expiry dateMar 1, 2028

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/964

Abstract

The present invention provides a nitride semiconductor device. The nitride semiconductor device comprises an n-type nitride semiconductor layer formed on a nitride crystal growth substrate. An active layer is formed on the n-type nitride semiconductor layer. A first p-type nitride semiconductor layer is formed on the active layer. A micro-structured current diffusion pattern is formed on the first p-type nitride semiconductor layer. The current diffusion pattern is made of an insulation material. A second p-type nitride semiconductor layer is formed on the first p-type nitride semiconductor layer having the current diffusion pattern formed thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.