Low-k isolation spacers for conductive regions
US7687364B2 · kind B2 · utility
9Cited by
3References
17Claims
0Family size
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Inventor
Key dates
| Filing date | Aug 7, 2006 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Sep 7, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S257/90
Abstract
A multi-component low-k isolation spacer for a conductive region in a semiconductor structure is described. In one embodiment, a replacement isolation spacer process is utilized to enable the formation of a two-component low-k isolation spacer adjacent to a sidewall of a gate electrode in a MOS-FET device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.