Patent · US Active

Deposition of complex nitride films

US7691757B2 · kind B2 · utility

9Cited by
110References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2007
Grant dateApr 6, 2010
Priority date
Expiry dateNov 25, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32053
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods are provided for pulsed chemical vapor deposition (CVD) of complex nitrides, such as ternary metal nitrides. Pulses of metal halide precursors are separated from one another and nitrogen-containing precursor is provided during the metal halide precursor pulses as well as between the metal halide precursor pulses. Two different metal halide precursors can be provided in simultaneous pulses, alternatingly, or in a variety of sequences. The nitrogen-containing precursor, such as ammonia, can be provided in pulses simultaneously with the metal halide precursors and between the metal halide precursors, or continuously throughout the deposition. Temperatures can be kept between about 300° C. and about 700° C.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.