Device for analyzing an integrated circuit
US7692151B2 · kind B2 · utility
0Cited by
5References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 2, 2006 |
| Grant date | Apr 6, 2010 |
| Priority date | — |
| Expiry date | Oct 2, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device (10) for analyzing a circuit (14) includes at least one element (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in the zone; elements (26) for exciting the circuit. The circuit exciting elements include a laser source (26) and elements (30) for applying a laser beam generated by the source on the observation zone (22). The device includes members (M1, M2) for protecting the observation zone (22) against the incident and reflected laser beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.