Romain Desplats
23Patents
6h-index
18Co-inventors
62Inventor score
Filing activity: May 21, 1999 → Apr 28, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7190822B2 | Method for customizing an integrated circuit element | Physics | 20 | Expired |
| US6967491B2 | Spatial and temporal selective laser assisted fault localization | Physics | 18 | Expired |
| US6526546B1 | Method for locating faulty elements in an integrated circuit | Physics | 10 | Expired |
| US6943572B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 10 | Expired |
| US6891363B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 9 | Expired |
| US7439730B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 7 | Expired |
| US6552341B1 | Installation and method for microscopic observation of a semiconductor electronic circuit | Electricity | 6 | Expired |
| US6970759B2 | Method and device for automatic optimal location of an operation on an integrated circuit | Electricity | 6 | Expired |
| US7400154B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 6 | Expired |
| US7323862B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 4 | Expired |
| US7038442B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 3 | Expired |
| US7408342B2 | Device for measuring a component of current based on magnetic fields | Physics | 3 | Expired |
| US7417424B2 | Magnetic-field-measuring device | Physics | 2 | Expired |
| US7411391B2 | Magnetic-field-measuring probe | Physics | 2 | Expired |
| US8344538B2 | Wind-powered device for producing electrical energy | Emerging Cross-Sectional Technologies | 2 | Active |
| US7560940B2 | Method and installation for analyzing an integrated circuit | Physics | 1 | Expired |
| US6816614B1 | Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip | Physics | 1 | Expired |
| US10388148B2 | Method of controlling a calculation device via a mobile element and control system implementing this method | Physics | 0 | Active |
| US8555728B2 | Method and installation for exposing the surface of an integrated circuit | Electricity | 0 | Active |
| US6948107B1 | Method and installation for fast fault localization in an integrated circuit | Physics | 0 | Expired |
| US6844625B2 | Method for producing input/output permutation of several conductive strips with parallel branches of an integrated circuit and resulting circuit | Electricity | 0 | Expired |
| US8326558B2 | Method of analyzing an integrated circuit, method of observation and their associated installations | Physics | 0 | Active |
| US7692151B2 | Device for analyzing an integrated circuit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.