System and method for device testing
US7697928B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2006 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Jan 24, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/21
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An electronic device (120) is provided that comprises: a transceiver circuit (310) configured to send and receive signals; a memory unit (330) configured to contain testing, configuration, and calibration (TCC) code (440, 450, 460) used to define TCC functions in the device, and operational code (470) used to define operational functions in the device; and a device controller (320) connected to the transceiver circuit and the memory unit, configured to control the device in an operational mode in accordance with the operational code and operational instructions received via the transceiver circuit (650), and to control the device in a TCC mode in accordance with the TCC code and TCC instructions received via the transceiver circuit (635, 640). The device controller is further configured to permanently disable access to at least a portion of the TCC code in response to a disable instruction received via the transceiver circuit (645).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.