Patent · US Active

Functional frequency testing of integrated circuits

US7698611B2 · kind B2 · utility

1Cited by

3References

24Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Gary D. Grise · Colchester, US
Steven F. Oakland · Colchester, US
Anthony S. Polson · Jericho, US
Philip Stevens · Stuttgart, DE

Key dates

Filing date	Jul 2, 2007
Grant date	Apr 13, 2010
Priority date	—
Expiry date	Mar 2, 2028

Classification

Technology area (CPC H)Electricity
CPC primaryH03K3/35625
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.