Patent · US Active

Active test socket

US7701200B1 · kind B1 · utility

2Cited by

3References

14Claims

0Family size

Assignee

Interconnect Devices, Inc. · US

Inventors

Steven Fahrner · Chandler, US
Daniel Marcus · Oakland, US
James Jaquette · Mesa, US

Key dates

Filing date	Feb 6, 2007
Grant date	Apr 20, 2010
Priority date	—
Expiry date	Apr 15, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0483
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test socket comprises a test socket body with a central opening configured to receive a device under test (DUT) including at least one arm opening in the test socket body; and at least one rotating arm disposed in the arm opening.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.